Ultramicroscopy

Ultramicroscopy journal artwork

Publisher: Elsevier |  Publishing Format: Other   | Impact Factor: Not provided


Publishes research on advanced microscopy methods, instrumentation, imaging, diffraction, and spectroscopy. It can be relevant to electrical and electronic engineering research involving semiconductor characterization, nanodevices, and electronic materials.


Keywords

Electrical Engineering, Electron Microscopy, Semiconductor Characterization, Nanotechnology, Materials Analysis


Details
Publication Format:  Other
Year Established:  1975
Periodicity:  Others
Editor in Chief
Angus Kirkland
Country:  United Kingdom

Email:   angus.kirkland@mater.ox.ac.uk
Publisher
Elsevier
Country: Netherlands

Website:   Official journal website



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